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CuxAg1−xInS2 solid thin films were fabricated through a low-cost process.  Particular process-related enhanced properties lead to reaching a minimum of lattice mismatch between absorber and  buffer layers within particular solar cell devices.  First, copper-less  samples X-ray diffraction analysis depicts the presence of AgInS2 ternary compound in chalcopyrite tetragonal phase with privileged (112) peak (d112=1.70 Å) according to JCPDS 75-0118 card. Second, when x content increases, we note a shift of the same preferential orientation (112) and its value reaches 1.63 Å corresponding to CuInS2 chalcopyrite tetragonal material according to JCPDS 89-6095 file. Finally, the formation and stability of these quaternaries have been discussed in terms of the lattice compatibility in relation with silver-copper duality within indium disulfide lattice structure. Plausible explanations for the extent and dynamics of copper incorporation inside AgInS2 elaborated ternary matrices have been proposed

journal of materials

Structural Investigation of Photocatalyst Solid Ag1−xCuxInS2 Quaternary Alloys Sprayed Thin Films Optimized within the Lattice Compatibility Theory (LCT) Scope