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Parameter Estimation for Type III Discrete Weibull Distribution: A Comparative Study
Author(s) -
Alessandro Barbiero
Publication year - 2013
Publication title -
journal of probability and statistics
Language(s) - English
Resource type - Journals
eISSN - 1687-9538
pISSN - 1687-952X
DOI - 10.1155/2013/946562
Subject(s) - weibull distribution , reliability (semiconductor) , sample size determination , monte carlo method , computer science , mathematics , algorithm , mathematical optimization , statistics , power (physics) , physics , quantum mechanics
The type III discrete Weibull distribution can be used in reliability analysis for modeling failure data such as the number of shocks, cycles, or runs a component or a structure can overcome before failing. This paper describes three methods for estimating its parameters: two customary techniques and a technique particularly suitable for discrete distributions, which, in contrast to the two other techniques, provides analytical estimates, whose derivation is detailed here. The techniques’ peculiarities and practical limits are outlined. A Monte Carlo simulation study has been performed to assess the statistical performance of these methods for different parameter combinations and sample sizes and then give some indication for their mindful use. Two applications of real data are provided with the aim of showing how the type III discrete Weibull distribution can fit real data, even better than other popular discrete models, and how the inferential procedures work. A software implementation of the model is also provided

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