Growth and Characterization of Pure and Doped L-Alanine Tartrate Single Crystals
Author(s) -
K. Rajesh,
B. Milton Boaz,
P. Praveen Kumar
Publication year - 2013
Publication title -
journal of materials
Language(s) - English
Resource type - Journals
eISSN - 2314-4874
pISSN - 2314-4866
DOI - 10.1155/2013/613092
Subject(s) - lanthanum , materials science , single crystal , dopant , doping , crystal (programming language) , crystallography , analytical chemistry (journal) , vickers hardness test , crystal growth , tartrate , indentation hardness , chemistry , inorganic chemistry , microstructure , metallurgy , chromatography , optoelectronics , computer science , programming language
Single crystals of pure and Lanthanum doped L-Alanine Tartrate were grown by slow evaporation method. The cell parameters were determined using single crystal X-ray diffraction method. To improve the physical properties of the LAT crystal, Lanthanum dopant was added by 2 mol%. ICP studies confirm the presence of Lanthanum in the grown LAT crystal. Transparency range of the crystal was determined using UV-VIS-NIR spectrophotometer. The functional groups of pure and doped LAT crystals were analyzed by FT-IR spectroscopy. Using Vickers microhardness tester, mechanical strength of the material was found. Dielectric studies of pure and doped LAT single crystals were carried out. The doped LAT crystal is found to have efficiency higher than that of pure LAT crystal
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