Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance? | Zendy

Jia-Sheng Huang | Zendy

Open Access

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Author(s) -

Jia-Sheng Huang

Publication year - 2013

Publication title -

advances in optoelectronics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.118

H-Index - 21

eISSN - 1687-5648

pISSN - 1687-563X

DOI - 10.1155/2013/568945

Subject(s) - reliability (semiconductor) , laser , burn in , semiconductor laser theory , semiconductor , division (mathematics) , multiplexing , reliability engineering , materials science , engineering , optics , electronic engineering , optoelectronics , physics , mathematics , power (physics) , arithmetic , quantum mechanics

Effective and economical burn-in screening is important for technology development and manufacture of semiconductor lasers. We study the burn-in degradation behavior of wavelength-division multiplexing semiconductor lasers to determine the feasibility of short burn-in. The burn-in is characterized by the sublinear model and correlated with long-term reliability

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