Truncated Life Test Plans for Economic Reliability Based on Four-Parametric Burr Distribution | Zendy

Ramkumar T. Balan | Zendy; Sajana O. Kunjunni | Zendy

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Truncated Life Test Plans for Economic Reliability Based on Four-Parametric Burr Distribution

Author(s) -

Ramkumar T. Balan,

Sajana O. Kunjunni

Publication year - 2013

Publication title -

journal of industrial mathematics

Language(s) - English

Resource type - Journals

eISSN - 2314-8853

pISSN - 2314-6117

DOI - 10.1155/2013/489285

Subject(s) - test plan , reliability (semiconductor) , reliability engineering , parametric statistics , test (biology) , acceptance sampling , statistics , plan (archaeology) , distribution (mathematics) , sample (material) , computer science , mathematics , sample size determination , engineering , weibull distribution , paleontology , history , power (physics) , physics , mathematical analysis , chemistry , archaeology , chromatography , quantum mechanics , biology

Burr distribution is considered as a probability model for the lifetime of products. Reliability test plans are those sampling plans in which items from a lot are put to test to make conclusions on the estimate of life, and hence acceptance or rejection of the submitted lot is done. A test plan designs the termination time of the experiment and the termination number for a given sample size and producer’s risk. Tables and graphs were provided for certain specific values of designs, and it is useful to verify the optimum reliability test plan realized by Burr distributions

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