Optical Characterization of Porous Sputtered Silver Thin Films | Zendy

Olivier Carton | Zendy; Jaouad Ghaymouni | Zendy; M. Lejeune | Zendy; A. Zeinert | Zendy

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Optical Characterization of Porous Sputtered Silver Thin Films

Author(s) -

Olivier Carton,

Jaouad Ghaymouni,

M. Lejeune,

A. Zeinert

Publication year - 2013

Publication title -

journal of spectroscopy

Language(s) - English

Resource type - Journals

eISSN - 2314-4920

pISSN - 2314-4939

DOI - 10.1155/2013/307824

Subject(s) - drude model , porosity , materials science , sputtering , thin film , porous medium , characterization (materials science) , plasma , sputter deposition , 3d optical data storage , resonance (particle physics) , optoelectronics , optics , composite material , nanotechnology , physics , atomic physics , quantum mechanics

The optical properties of various porous silver films, grown with a commercial DC sputter coater, were investigated and compared for different plasma parameters. Effective Drude models were successfully used for those films whose spectra did not show particular resonance peaks. For the other films, neither an effective Drude model nor effective medium models (Maxwell Garnett, Bruggeman, and Looyenga) can describe the optical properties. It turns out that a more general approach like the Bergman representation describes the optical data of these films accurately adopting porosity values consistent with physical measurements

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