Synthesis and Characterization of Graphene Thin Films by Chemical Reduction of Exfoliated and Intercalated Graphite Oxide | Zendy

Force Tefo Thema | Zendy; Makwena J. Moloto | Zendy; Ezekiel Dixon Dikio | Zendy; Nangamso Nathaniel Nyangiwe | Zendy; L. Kotsedi | Zendy; M. Mâaza | Zendy; Mohammed Khenfouch | Zendy

Open Access

Synthesis and Characterization of Graphene Thin Films by Chemical Reduction of Exfoliated and Intercalated Graphite Oxide

Author(s) -

Force Tefo Thema,

Makwena J. Moloto,

Ezekiel Dixon Dikio,

Nangamso Nathaniel Nyangiwe,

L. Kotsedi,

M. Mâaza,

Mohammed Khenfouch

Publication year - 2012

Publication title -

journal of chemistry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.436

H-Index - 50

eISSN - 2090-9063

pISSN - 2090-9071

DOI - 10.1155/2013/150536

Subject(s) - graphene , exfoliation joint , graphite , raman spectroscopy , chemistry , graphite oxide , oxide , graphene oxide paper , intercalation (chemistry) , hydrazine (antidepressant) , chemical engineering , graphite intercalation compound , inorganic chemistry , nanotechnology , organic chemistry , materials science , optics , physics , engineering , chromatography

Commercial flakes of graphite were prepared into functionalized graphene oxide (GO) by chemical treatment. After the exfoliation and intercalation of graphene into functionalized graphene oxide that formed stable colloidal dispersion in polar aprotic solvent, the reduction process was undertaken by continuous stirring with hydrazine hydrate. The reduced material was characterized by X-ray diffraction (XRD), attenuated total reflectance (ATR) FT-IR, ultraviolet visible (UV-vis), atomic force microscopy (AFM) and Raman spectroscopy which confirm the oxidation of graphite and reduction of graphene oxide into graphene sheet

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