Surface-Enhanced Raman Scattering as an Emerging Characterization and Detection Technique
Author(s) -
Mustafa Çulha,
Brian M. Cullum,
Nickolay V. Lavrik,
Charles Kofi Klutse
Publication year - 2012
Publication title -
journal of nanotechnology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.347
H-Index - 29
eISSN - 1687-9511
pISSN - 1687-9503
DOI - 10.1155/2012/971380
Subject(s) - nanotechnology , characterization (materials science) , raman scattering , materials science , surface enhanced raman spectroscopy , cover (algebra) , raman spectroscopy , optics , engineering , physics , mechanical engineering
While surface-enhanced Raman spectroscopy (SERS) has been attracting a continuously increasing interest of scientific community since its discovery, it has enjoyed a particularly rapid growth in the last decade. Most notable recent advances in SERS include novel technological approaches to SERS substrates and innovative applications of SERS in medicine and molecular biology. While a number of excellent reviews devoted to SERS appeared in the literature over the last two decades, we will focus this paper more specifically on several promising trends that have been highlighted less frequently. In particular, we will briefly overview strategies in designing and fabricating SERS substrates using deterministic patterning and then cover most recent biological applications of SERS
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