Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope | Zendy

Keith Fraser | Zendy; John J. Boland | Zendy

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Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope

Author(s) -

Keith Fraser,

John J. Boland

Publication year - 2011

Publication title -

journal of sensors

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.399

H-Index - 43

eISSN - 1687-7268

pISSN - 1687-725X

DOI - 10.1155/2012/961239

Subject(s) - field ion microscope , evaporation , microscope , materials science , electric field , field (mathematics) , resolution (logic) , ion , microscopy , crystal (programming language) , atomic physics , optics , chemistry , physics , mathematics , thermodynamics , pure mathematics , organic chemistry , quantum mechanics , artificial intelligence , computer science , programming language

Imaging and evaporation of atoms in the field ion microscope (FIM) has been modelled by using finite difference methods to calculate the voltage distribution around a tip and hence the electric field strength experienced by individual atoms. Atoms are evaporated based on field strength using a number of different mathematical models which yield broadly similar results. The tip shapes and simulated FIM images produced show strong agreement with experimental results for tips of the same orientation and crystal structure. Calculations have also been made to estimate the effects on resolution of using a field-sharpened tip for scanning probe microscopy

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