Multilayer Inorganic Electrets with SiO 2 and Si 3 N 4
Author(s) -
Vladimir Leonov,
Chris Van Hoof
Publication year - 2012
Publication title -
smart materials research
Language(s) - English
Resource type - Journals
eISSN - 2090-3561
pISSN - 2090-357X
DOI - 10.1155/2012/904168
Subject(s) - electret , charge (physics) , dielectric , materials science , analytical chemistry (journal) , physics , chemistry , optoelectronics , composite material , quantum mechanics , chromatography
The physics and basic properties of electrets are discussed, namely, what happens during corona charging of dielectrics, why the surface potential and trapped charge show certain limits, where the trapped charge is stored, why and how the charge is released from traps at high temperatures. The experiments have been conducted on single-layer SiO2 and Si3N4 and on multilayer combination of these materials. A strong lateral mobility of charge trapped near the SiO2/Si3N4 interface was observed at elevated temperatures. The positively and negatively charged electrets are compared to each other. The experiments on charge retention at elevated temperatures have shown the studied electrets are suitable for devices working at temperatures of up to 200–300°C
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