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Heteroepitaxial Growth of Ge Nanowires on Si Substrates
Author(s) -
Pietro Artoni,
Alessia Irrera,
Emanuele Francesco Pecora,
Simona Boninelli,
C. Spinella,
F. Priolo
Publication year - 2012
Publication title -
international journal of photoenergy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.426
H-Index - 51
eISSN - 1687-529X
pISSN - 1110-662X
DOI - 10.1155/2012/782835
Subject(s) - faceting , nanowire , materials science , germanium , evaporation , transmission electron microscopy , nanotechnology , crystal growth , scanning transmission electron microscopy , silicon , crystallography , optoelectronics , chemistry , physics , thermodynamics
Electron beam evaporation has been used to prepare Ge nanowires (NWs) on top of (111) Si substrates. Despite the non-UHV growth conditions, scanning and transmission electron microscopies demonstrate that NWs are single crystal with specific crystallographic growth directions ([111], [110], and [112]). NWs are faceted, exhibiting the lower energy plans on the surface. The faceting depends on the growth direction. Moreover, the detrimental effects for Ge NWs growth of O atoms contamination are discussed. Finally, we describe how a proper preparation of the Au catalyst is able to increase the Ge NW density by a factor of 4, while heteroepitaxy and faceting features are maintained

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