Quality Evaluation for Microcrystalline Silicon Thin-Film Solar Cells by Single-Layer Absorption | Zendy

ShengHui Chen | Zendy; TingWei Chang | Zendy; Hsuan-Wen Wang | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Quality Evaluation for Microcrystalline Silicon Thin-Film Solar Cells by Single-Layer Absorption

Author(s) -

ShengHui Chen,

TingWei Chang,

Hsuan-Wen Wang

Publication year - 2012

Publication title -

international journal of photoenergy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.426

H-Index - 51

eISSN - 1687-529X

pISSN - 1110-662X

DOI - 10.1155/2012/653501

Subject(s) - microcrystalline , algorithm , computer science , materials science , analytical chemistry (journal) , chemistry , crystallography , chromatography

The absorption coefficient at 1.4 eV is divided by the value at 0.9 eV to obtain the factor used to judge the quality of μc-Si:H. PV device performance can be predicted by multiplying Voc with Isc when using this layer as an intrinsic layer. The results show a good relationship between the quality factor and the product of open-circuit voltage and short-circuit current. However, the final efficiency is influenced by the identities of the interface in the multilayer structure

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research