Electrical Transport Properties of Multilayered Single-Walled Carbon Nanotube Films
Author(s) -
Yanli Zhao,
Wenzhi Li
Publication year - 2012
Publication title -
journal of nanotechnology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.347
H-Index - 29
eISSN - 1687-9511
pISSN - 1687-9503
DOI - 10.1155/2012/601582
Subject(s) - materials science , carbon nanotube , electrical resistivity and conductivity , annealing (glass) , temperature coefficient , composite material , fabrication , metal , electrical resistance and conductance , nanotechnology , medicine , alternative medicine , pathology , electrical engineering , metallurgy , engineering
An improved layer-by-layer vacuum filtration method was adopted for the fabrication of single-walled carbon nanotube (SWCNT) films aiming at a series of SWCNT films with controllable thickness and density. The electrical transport properties of the multilayered SWCNT films have been investigated. With the constant film density, the decrease of the layer number of the SWCNT film results in an increase of the temperature coefficient of resistance (TCR). SWCNT film with 95% metallic nanotubes has shown a lower TCR than that of the SWCNT films with a low percentage of metallic nanotubes. The effect of thermal annealing and subsequent acid (HNO3) treatment on the electrical properties of the SWCNT films has also been investigated
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom