Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization | Zendy

J. Vaněk | Zendy; Jan Dolensky | Zendy; Z. Chobola | Zendy; Mirek Luňák | Zendy; A. Poruba | Zendy

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Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

Author(s) -

J. Vaněk,

Jan Dolensky,

Z. Chobola,

Mirek Luňák,

A. Poruba

Publication year - 2012

Publication title -

international journal of photoenergy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.426

H-Index - 51

eISSN - 1687-529X

pISSN - 1110-662X

DOI - 10.1155/2012/324853

Subject(s) - microplasma , monocrystalline silicon , common emitter , materials science , solar cell , optoelectronics , noise (video) , energy conversion efficiency , silicon , analytical chemistry (journal) , chemistry , physics , plasma , computer science , environmental chemistry , quantum mechanics , artificial intelligence , image (mathematics)

This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process

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