Wide Range Temperature Sensors Based on One-Dimensional Photonic Crystal with a Single Defect
Author(s) -
Arun Kumar,
Vipin Kumar,
Bhuvneshwer Suthar,
A. Bhargava,
Kh. S. Singh,
S. P. Ojha
Publication year - 2012
Publication title -
international journal of microwave science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.125
H-Index - 11
eISSN - 1687-5834
pISSN - 1687-5826
DOI - 10.1155/2012/182793
Subject(s) - refractive index , materials science , photonic crystal , transfer matrix method (optics) , wavelength , optics , transmission (telecommunications) , atmospheric temperature range , blueshift , optoelectronics , layer (electronics) , range (aeronautics) , crystal (programming language) , composite material , physics , telecommunications , meteorology , computer science , photoluminescence , programming language
Transmission characteristics of one-dimensional photonic crystal structure with a defect have been studied. Transfer matrix method has been employed to find the transmission spectra of the proposed structure. We consider a Si/air multilayer system and refractive index of Si layer has been taken as temperature dependent. As the refractive index of Si layer is a function of temperature of medium, so the central wavelength of the defect mode is a function of temperature. Variation in temperature causes the shifting of defect modes. It is found that the average change or shift in central wavelength of defect modes is 0.064 nm/K. This property can be exploited in the design of a temperature sensor
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