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Scanning Optical Head with Nontilted Reference Beam: Assuring Nanoradian Accuracy for a New Generation Surface Profiler in the Large-Slope Testing Range
Author(s) -
Shinan Qian
Publication year - 2011
Publication title -
international journal of optics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.263
H-Index - 17
eISSN - 1687-9392
pISSN - 1687-9384
DOI - 10.1155/2011/902158
Subject(s) - range (aeronautics) , synchrotron radiation , optics , beam (structure) , computer science , materials science , physics , composite material
Nanoradian Surface Profilers (NSPs) are required for state-of-the-art synchrotron radiation optics and high-precision optical measurements. Nano-radian accuracy must be maintained in the large-angle test range. However, the beams' notable lateral motions during tests of most operating profilers, combined with the insufficiencies of their optical components, generate significant errors of ∼1 μrad rms in the measurements. The solution to nano-radian accuracy for the new generation of surface profilers in this range is to apply a scanning optical head, combined with nontilted reference beam. I describe here my comparison of different scan modes and discuss some test results

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