Purity and Defect Characterization of Single-Wall Carbon Nanotubes Using Raman Spectroscopy | Zendy

Yasumitsu Miyata | Zendy; Kohei Mizuno | Zendy; Hiromichi Kataura | Zendy

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Purity and Defect Characterization of Single-Wall Carbon Nanotubes Using Raman Spectroscopy

Author(s) -

Yasumitsu Miyata,

Kohei Mizuno,

Hiromichi Kataura

Publication year - 2010

Publication title -

journal of nanomaterials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.463

H-Index - 66

eISSN - 1687-4129

pISSN - 1687-4110

DOI - 10.1155/2011/786763

Subject(s) - materials science , raman spectroscopy , carbon nanotube , scanning electron microscope , thermogravimetric analysis , chemical vapor deposition , analytical chemistry (journal) , d band , spectroscopy , carbon fibers , characterization (materials science) , nanotechnology , chemical engineering , optics , composite material , chemistry , physics , engineering , chromatography , quantum mechanics , composite number

We investigated the purity and defects of single-wall carbon nanotubes (SWCNTs) produced by various synthetic methods including chemical vapor deposition, arc discharge, and laser ablation. The SWCNT samples were characterized using scanning electron microscopy (SEM), thermogravimetric analysis (TGA), and Raman spectroscopy. Quantitative analysis of SEM images suggested that the G-band Raman intensity serves as an index for the purity. By contrast, the intensity ratio of G-band to D-band (G/D ratio) reflects both the purity and the defect density of SWCNTs. The combination of G-band intensity and G/D ratio is useful for a quick, nondestructive evaluation of the purity and defect density of a SWCNT sample

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