Probabilistic Modeling of Fatigue Damage Accumulation for Reliability Prediction
Author(s) -
Vijay Rathod,
Om Prakash Yadav,
Ajay Pal Singh Rathore,
Rakesh Jain
Publication year - 2011
Publication title -
journal of quality and reliability engineering
Language(s) - English
Resource type - Journals
eISSN - 2314-8047
pISSN - 2314-8055
DOI - 10.1155/2011/718901
Subject(s) - reliability (semiconductor) , reliability engineering , probabilistic logic , computer science , engineering , artificial intelligence , physics , power (physics) , quantum mechanics
A methodology for probabilistic modeling of fatigue damage accumulation for single stress level and multistress level loading is proposed in this paper. The methodology uses linear damage accumulation model of Palmgren-Miner, a probabilistic S-N curve, and an approach for a one-to-one transformation of probability density functions to achieve the objective. The damage accumulation is modeled as a nonstationary process as both the expected damage accumulation and its variability change with time. The proposed methodology is then used for reliability prediction under single stress level and multistress level loading, utilizing dynamic statistical model of cumulative fatigue damage. The reliability prediction under both types of loading is demonstrated with examples
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