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Determining Contact Angle and Surface Energy of Co60Fe20B20Thin Films by Magnetron Sputtering
Author(s) -
S. K. Wang,
Yuan-Tsung Chen,
ShengRui Jian
Publication year - 2011
Publication title -
journal of nanomaterials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.463
H-Index - 66
eISSN - 1687-4129
pISSN - 1687-4110
DOI - 10.1155/2011/291935
Subject(s) - materials science , annealing (glass) , thin film , analytical chemistry (journal) , nanotechnology , composite material , chemistry , chromatography
This study examined the deposition of CoFeB thin films on a glass substrate at room temperature (RT), as well as the effects of conducting postannealing at heat annealing TA=150°C for 1 h. The thickness (tf) of the CoFeB thin films ranged from 100 Å to 500 Å. The microstructure, average contact angle, and surface energy properties were also investigated. X-ray diffraction (XRD) revealed that CoFeB films are nanocrystalline at RT and that post-annealing treatment increases in conjunction with the crystallinity. The surface energy of the CoFeB thin films is related to adhesive strength. The CoFeB films form a contact angle of larger than 90∘ with water as a test liquid. This finding demonstrates that the CoFeB film is hydrophobic. As tf increases from 100 Å to 500 Å, the surface energy at RT decreases from 40 mJ/mm2 to 32 mJ/mm2. During post-annealing treatment, the surface energy increases from 32 mJ/mm2 to 35 mJ/mm2, as tf increases from 100 Å to 300 Å; then it decreases to 31 mJ/mm2, as tf increases from 300 Å to 500 Å. The surface energy of the as-deposited CoFeB thin films exceeds that during post-annealing treatment at thicknesses of 100 Å and 200 Å, suggesting that as-deposited CoFeB thin film increases the adhesion

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