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Robust Affine Invariant Descriptors
Author(s) -
Jianwei Yang,
Zirun Chen,
Wensheng Chen,
Yunjie Chen
Publication year - 2011
Publication title -
mathematical problems in engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.262
H-Index - 62
eISSN - 1026-7077
pISSN - 1024-123X
DOI - 10.1155/2011/185303
Subject(s) - affine transformation , affine shape adaptation , affine hull , affine geometry of curves , harris affine region detector , mathematics , affine coordinate system , invariant (physics) , affine combination , artificial intelligence , pattern recognition (psychology) , algorithm , computer vision , computer science , affine space , geometry , mathematical physics
An approach is developed for the extraction of affine invariant descriptors by cutting object into slices. Gray values associated with every pixel in each slice are summed up to construct affine invariant descriptors. As a result, these descriptors are very robust to additive noise. In order to establish slices of correspondence between an object and its affine transformed version, general contour (GC) of the object is constructed by performing projection along lines with different polar angles. Consequently, affine in-variant division curves are derived. A slice is formed by points fall in the region enclosed by two adjacent division curves. To test and evaluate the proposed method, several experiments have been conducted. Experimental results show that the proposed method is very robust to noise

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