Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy | Zendy

Glenda Biasotto | Zendy; A.Z. Simões | Zendy; C.S. Riccardi | Zendy; M.A. Zaghete | Zendy; E. Longo | Zendy; J.A. Varela | Zendy

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Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

Author(s) -

Glenda Biasotto,

A.Z. Simões,

C.S. Riccardi,

M.A. Zaghete,

E. Longo,

J.A. Varela

Publication year - 2010

Publication title -

advances in materials science and engineering

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.356

H-Index - 42

eISSN - 1687-8442

pISSN - 1687-8434

DOI - 10.1155/2010/710269

Subject(s) - materials science , x ray photoelectron spectroscopy , analytical chemistry (journal) , nuclear magnetic resonance , chemistry , physics , chromatography

CaBi(4)Ti(4)O(15) (CBTi144) thin films were grown on Pt/Ti/SiO(2)/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM). The films present a single phase of layered-structured perovskite with polar axis orient. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films. We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice

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