Preparation and Characterization ofSb 2 Te 3 Thin Films by Coevaporation
Author(s) -
Bin Lv,
Songbai Hu,
Wei Li,
Di Xia,
Liang-Huan Feng,
Jingquan Zhang,
Lili Wu,
Yaping Cai,
Bing Li,
Lei Zhi
Publication year - 2010
Publication title -
international journal of photoenergy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.426
H-Index - 51
eISSN - 1687-529X
pISSN - 1110-662X
DOI - 10.1155/2010/476589
Subject(s) - materials science , algorithm , computer science
Deposition of Sb2Te3 thin films on soda-lime glass substrates by coevaporation of Sb and Te is described in this paper. Sb2Te3 thin films were characterized by x-ray diffraction (XRD), x-ray fluorescence (XRF), atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), electrical conductivity measurements, and Hall measurements. The abnormal electrical transport behavior occurred from in situ electrical conductivity measurements. The results indicate that as-grown Sb2Te3 thin films are amorphous and undergo an amorphous-crystalline transition after annealing, and the posttreatment can effectively promote the formation of Sb-Te bond and prevent oxidation of thin film surface
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