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Deposition of Sb2Te3 thin films on soda-lime glass substrates by coevaporation of Sb and Te is described in this paper. Sb2Te3 thin films were characterized by x-ray diffraction (XRD), x-ray fluorescence (XRF), atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), electrical conductivity measurements, and Hall measurements. The abnormal electrical transport behavior occurred from in situ electrical conductivity measurements. The results indicate that as-grown Sb2Te3 thin films are amorphous and undergo an amorphous-crystalline transition after annealing, and the posttreatment can effectively promote the formation of Sb-Te bond and prevent oxidation of thin film surface

international journal of photoenergy

Preparation and Characterization of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:msub><mml:mrow><mml:mtext>Sb</mml:mtext></mml:mrow><mml:mtext>2</mml:mtext></mml:msub><mml:msub><mml:mrow><mml:mtext>Te</mml:mtext></mml:mrow><mml:mtext>3</mml:mtext></mml:msub></mml:mrow></mml:math>Thin Films by Coevaporation

Preparation and Characterization ofSb2Te3Thin Films by Coevaporation