Mapping Quantitative Trait Loci Using Distorted Markers | Zendy

Shizhong Xu | Zendy; Zhiqiu Hu | Zendy

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Mapping Quantitative Trait Loci Using Distorted Markers

Author(s) -

Shizhong Xu,

Zhiqiu Hu

Publication year - 2009

Publication title -

international journal of plant genomics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.454

H-Index - 30

eISSN - 1687-5370

pISSN - 1687-5389

DOI - 10.1155/2009/410825

Subject(s) - quantitative trait locus , family based qtl mapping , mendelian inheritance , genotyping , locus (genetics) , inclusive composite interval mapping , biology , genetics , computational biology , computer science , gene mapping , gene , genotype , chromosome

Quantitative trait locus (QTL) mapping is usually performed using markers that follow a Mendelian segregation ratio. We developed a new method of QTL mapping that can use markers with segregation distortion (non-Mendelian markers). An EM (expectation-maximization) algorithm is used to estimate QTL and SDL (segregation distortion loci) parameters. The joint analysis of QTL and SDL is particularly useful for selective genotyping. Application of the joint analysis is demonstrated using a real life data from a wheat QTL mapping experiment.

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