High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition | Zendy

Kei Tanaka | Zendy; Masamichi Yoshimura | Zendy; Kazuyuki Ueda | Zendy

Open Access

High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition

Author(s) -

Kei Tanaka,

Masamichi Yoshimura,

Kazuyuki Ueda

Publication year - 2008

Publication title -

journal of nanomaterials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.463

H-Index - 66

eISSN - 1687-4129

pISSN - 1687-4110

DOI - 10.1155/2009/147204

Subject(s) - materials science , transmission electron microscopy , carbon nanotube , chemical vapor deposition , scanning electron microscope , analytical chemistry (journal) , microwave , magnetic force microscope , microscopy , nanotechnology , composite material , magnetic field , optics , chemistry , magnetization , physics , chromatography , quantum mechanics

Carbon nanotubes (CNTs) have been successfully grown on the tip apex of an atomic force microscopy (AFM) cantilever by microwave plasma-enhanced chemical vapor deposition (MPECVD). Both scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observations reveal that the diameter of the CNTs is ∼30 nm and the magnetic particles with diameter of ∼20 nm, which was used as catalyst for the CNT growth, exist on the top. This CNT probe has been applied to magnetic force microscopy (MFM) on the ultrahigh-density magnetic recording media with 1200 kilo flux change per inch (kfci)

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