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Phase Velocity Estimation of a Microstrip Line in a Stoichiometric Periodically Domain‐Inverted LiTaO3 Modulator Using Electro‐Optic Sampling Technique
Author(s) -
Shintaro Hisatake,
Akira Kaino,
Tomoaki Yasuda,
Tadao Nagatsuma
Publication year - 2008
Publication title -
advances in optoelectronics
Language(s) - English
Resource type - Journals
eISSN - 1687-5648
pISSN - 1687-563X
DOI - 10.1155/2008/752847
Subject(s) - wavelength , microstrip , phase velocity , electric field , microwave , optics , phase modulation , materials science , phase (matter) , waveform , voltage , physics , phase noise , quantum mechanics
We estimate the phase velocity of a modulation microwave in a quasi-velocity-matched (QVM) electro-optic (EO) phase modulator (QVM-EOM) using EO sampling which is accurate and the most reliable technique for measuring voltage waveforms at an electrode. The substrate of the measured QVM-EOM is a stoichiometric periodically domain-inverted LiTaO3 crystal. The electric field of a standing wave in a resonant microstrip line (width: 0.5 mm, height: 0.5 mm) is measured by employing a CdTe crystal as an EO sensor. The wavelength of the traveling microwave at 16.0801 GHz is determined as 3.33 mm by fitting the theoretical curve to the measured electric field distribution. The phase velocity is estimated as vm=5.35×107 m/s, though there exists about 5% systematic error due to the perturbation by the EO sensor. Relative dielectric constant of εr=41.5 is led as the maximum likelihood value that derives the estimated phase velocity

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