Material Parameter Measurements for Microwave Antireflection Coating Development | Zendy

Lajos Nagy | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Material Parameter Measurements for Microwave Antireflection Coating Development

Author(s) -

Lajos Nagy

Publication year - 2008

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.144

H-Index - 22

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/2008/247958

Subject(s) - microwave , finite difference time domain method , materials science , characterization (materials science) , coaxial , range (aeronautics) , optics , coating , particle (ecology) , reflection (computer programming) , scattering parameters , mixing (physics) , material properties , computational physics , acoustics , composite material , physics , computer science , engineering , mechanical engineering , oceanography , quantum mechanics , geology , programming language

The main steps for characterization and measurement of microwave absorbent materials in the 1–10 GHz range are introduced. The coaxial reflection-transmission type of material parameter measurement is analyzed in detail and the main measurement error is corrected. The microscopic material particle parameter measurement concept is also presented using different mixing rule laws to determine the material parameters of the single particles from the macroscopic parameters. Two-dimensional FDTD simulations have been used to model the behavior of mixed electric and magnetic type of material

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research