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Custom Hardware Processor to Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks
Author(s) -
Juan A. GómezPulido,
F. SánchezBajo,
Sidolina P. Santos,
Miguel A. VegaRodríguez,
Juan M. SánchezPérez
Publication year - 2008
Publication title -
x-ray optics and instrumentation
Language(s) - English
Resource type - Journals
eISSN - 1687-7640
pISSN - 1687-7632
DOI - 10.1155/2008/168237
Subject(s) - figure of merit , set (abstract data type) , computer science , diffraction , software , measure (data warehouse) , quality (philosophy) , order (exchange) , algorithm , computer engineering , computer hardware , computational science , optics , physics , computer vision , programming language , data mining , quantum mechanics , finance , economics
A custom processorbased on reconfigurable hardware technology isproposed in order to compute the figure of meritused to measure the quality of the fit ofX-ray diffraction peaks. As the experimentalX-ray profiles can present many peaks severelyoverlapped, it is necessary to select the bestmodel among a large set of reasonably goodsolutions. Determining the best solution iscomputationally intensive, because this is ahard combinatorial optimization problem. Theproposed processors, working in parallel,increase the performance relative to a softwareimplementation

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