Antirandom Testing: A Distance‐Based Approach | Zendy

ShenHui Wu | Zendy; S. Jandhyala | Zendy; Yashwant K. Malaiya | Zendy; Anura P. Jayasumana | Zendy

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Antirandom Testing: A Distance‐Based Approach

Author(s) -

ShenHui Wu,

S. Jandhyala,

Yashwant K. Malaiya,

Anura P. Jayasumana

Publication year - 2008

Publication title -

vlsi design

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.123

H-Index - 24

eISSN - 1065-514X

pISSN - 1026-7123

DOI - 10.1155/2008/165709

Subject(s) - orthogonal array testing , pseudorandom number generator , random testing , bridging (networking) , algorithm , computer science , fault coverage , test strategy , test (biology) , mathematics , reliability engineering , test case , machine learning , engineering , software , computer network , software construction , regression analysis , electrical engineering , software system , electronic circuit , programming language , paleontology , biology

Random testing requires each test to be selected randomly regardless of the tests previously applied. This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. An algorithm for generating antirandom tests is presented. Compared with traditional pseudorandom testing, antirandom testing is found to be very effective when a high-fault coverage needs to be achieved with a limited number of test vectors. The superiority of the new approach is even more significant for testing bridging faults

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