Power Consumption and BER of Flip-Flop Inserted Global Interconnect
Author(s) -
Jingye Xu,
Abinash Roy,
Masud H. Chowdhury
Publication year - 2007
Publication title -
vlsi design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.123
H-Index - 24
eISSN - 1065-514X
pISSN - 1026-7123
DOI - 10.1155/2007/42829
Subject(s) - interconnection , repeater (horology) , flip flop , reliability (semiconductor) , computer science , electronic engineering , power (physics) , power consumption , engineering , cmos , telecommunications , physics , quantum mechanics , artificial intelligence , encoding (memory)
In nanometer scale integrated circuits, concurrent insertion of repeaters and sequential elements into the global interconnect lines has been proposed to support multicycle communication—a concept known as interconnect pipelining. The design targets of an interconnect-pipelining scheme are to ensure high reliability, low-power consumption, and less delay cycles. This paper presents an in-depth analysis of the reliability in terms of bit error rate (BER) and the power consumption of wire-pipelining scheme. In this analysis, the dependencies of power consumption and BER on the number of inserted flip-flops,and the size of repeaters are illustrated. To trade off the design targets (wire delay, BER,and power consumption), a methodology is developed to optimize the repeater size andthe number of flip-flops inserted which maximize a user-specified figure of merit.The methodology is demonstrated by calculating optimal solutions for interconnect pipeliningfor some International Technology Roadmap for Semiconductor technology nodes
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom