nm- andμ m-Scale Surface Roughness on Glass with Specific Optical Scattering Characteristics on Demand
Author(s) -
Henning Fouckhardt,
Ingo Steingoetter,
Matthias Brinkmann,
Malte Hagemann,
Helmut Zarschizky,
Lin Zschiedrich
Publication year - 2007
Publication title -
advances in optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.118
H-Index - 21
eISSN - 1687-5648
pISSN - 1687-563X
DOI - 10.1155/2007/27316
Subject(s) - borosilicate glass , surface roughness , scattering , etching (microfabrication) , amorphous solid , surface (topology) , materials science , range (aeronautics) , surface finish , scale (ratio) , optics , analytical chemistry (journal) , mineralogy , physics , geometry , mathematics , nanotechnology , crystallography , chemistry , composite material , quantum mechanics , layer (electronics) , chromatography
During maskless ion etching of amorphous glass, self-organization can arise in certain etch parameter ranges, which leads to dense-lying dots/cones with typical diameters and heights in the 30–300 nm range. Another phenomenon, which results in cone sizes around 1 μ m or more, is self-masking especially in the case of heterogeneous glasses like borosilicate glass as used in this contribution. Thus, a wide range of characteristic sizes and shapes of individual scatterers on the glass surface, jointly acting as a defined roughness, can be achieved resulting in specific optical scattering characteristics. This contribution gives results on borosilicate thin-glass dry etching. Certain surface morphologies are reported together with experimental results on their optical scattering characteristics.
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