Dielectric Resonator Method for Measuring the Electrical Conductivity of Carbon Nanotubes from Microwave to Millimeter Frequencies
Author(s) -
James BakerJarvis,
Michael D. Janezic,
John H. Lehman
Publication year - 2007
Publication title -
journal of nanomaterials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.463
H-Index - 66
eISSN - 1687-4129
pISSN - 1687-4110
DOI - 10.1155/2007/24242
Subject(s) - materials science , carbon nanotube , microwave , dielectric , electrical resistivity and conductivity , analytical chemistry (journal) , resonator , conductivity , nanotechnology , optoelectronics , computer science , chemistry , electrical engineering , telecommunications , engineering , chromatography
We describe a dielectric resonator-based measurement method for determining the electrical conductivity of carbon nanotubes at microwave to millimeter frequencies.This measurement method is not limited by the metal conductor contact resistances or impedance mismatch commonly encountered in the measurement of single nanotubes.The measurement of carbon nanotubes yielded conductivities of approximately 0.08×107 S/m
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