Langevin Forces and Generalized Transfer Fields for Noise Modelling in Deep Submicron Devices | Zendy

P. Shiktorov | Zendy; E. Starikov | Zendy; V. Gružinskis | Zendy; T. González | Zendy; J. Mateos | Zendy; D. Pardo | Zendy; L. Reggiani | Zendy; Luca Varani | Zendy; Jean-Claude Vaissière | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Langevin Forces and Generalized Transfer Fields for Noise Modelling in Deep Submicron Devices

Author(s) -

P. Shiktorov,

E. Starikov,

V. Gružinskis,

T. González,

J. Mateos,

D. Pardo,

L. Reggiani,

Luca Varani,

Jean-Claude Vaissière

Publication year - 2001

Publication title -

vlsi design

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.123

H-Index - 24

eISSN - 1065-514X

pISSN - 1026-7123

DOI - 10.1155/2001/82542

Subject(s) - noise (video) , energy transfer , field (mathematics) , scattering , statistical physics , voltage , current (fluid) , physics , energy (signal processing) , computational physics , spectral line , acoustics , mechanics , computer science , optics , engineering physics , mathematics , quantum mechanics , artificial intelligence , pure mathematics , image (mathematics) , thermodynamics

We present a generalized transfer field method with the microscopic noise sourcesdirectly connected with the velocity and energy change during single scattering events.The advantages of this method are illustrated by hydrodynamic calculations of currentand voltage noise spectra in several two-terminal submicron structures

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research