A Fast Algorithm for the Study of Wave-packet Scattering at Disordered Interfaces | Zendy

John R. Barker | Zendy; J.R. Watling | Zendy; R.C.W. Wilkins | Zendy

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A Fast Algorithm for the Study of Wave-packet Scattering at Disordered Interfaces

Author(s) -

John R. Barker,

J.R. Watling,

R.C.W. Wilkins

Publication year - 2001

Publication title -

vlsi design

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.123

H-Index - 24

eISSN - 1065-514X

pISSN - 1026-7123

DOI - 10.1155/2001/75462

Subject(s) - scattering , interface (matter) , monte carlo method , surface finish , limiting , wave packet , network packet , ab initio , materials science , surface roughness , computational physics , statistical physics , condensed matter physics , computational science , computer science , electronic engineering , physics , optics , engineering , mathematics , atomic physics , quantum mechanics , computer network , mechanical engineering , statistics , composite material , capillary number , capillary action

It has been known for many years that interface roughness scattering, particularly off the Si/SiO2 interface, is a limiting factor in device performance of MOSFETs. This becomes increasingly important as gate lengths are shrunk to decanano dimensions along with the move towards SiGe hetero-technology. However, analysis of interface transport is hampered by the lack of detailed physical models, especially for surfaces where intercalation occurs. This paper presents an efficient method for following the motion of wave-packets scattering off a rough interface. We are also able to calculated directly ab-initio interface scattering rates for use in Monte Carlo simulations.

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