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This paper presents a novel method for designing Totally Self-Checking (TSC) m-out-of-n code checkers taking into account a realistic fault model including stuck-at,transistor stuck-on, transistor stuck-open, resistive bridging faults and breaks. Theproposed design method is the first method in the open literature that takes into accounta realistic fault model and can be applied for most practical values of m and n. Apartfrom the above the proposed checkers are very compact and very fast. The single outputcheckers are near optimal with respect to the number of transistors required fortheir implementation. Another benefit of the proposed TSC checkers is that all faultsare tested by a very small set of single pattern tests, thus the probability of achievingthe TSC goal is greater than in checkers requiring two-pattern tests. The single outputTSC checkers proposed in this paper are the first known single output TSC checkersfor m-out-of-n codes

Novel Single and Double Output TSC CMOS Checkers for m-out-of-n Codes