Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures | Zendy

Muhammad Taher Abuelma′atti | Zendy; Isa S. Qamber | Zendy

Open Access

Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures

Author(s) -

Muhammad Taher Abuelma′atti,

Isa S. Qamber

Publication year - 2000

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.144

H-Index - 22

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/2000/85913

Subject(s) - spice , reliability engineering , reliability (semiconductor) , laplace transform , markov chain , equivalent circuit , markov model , computer science , emphasis (telecommunications) , markov process , electronic engineering , engineering , mathematics , electrical engineering , statistics , telecommunications , mathematical analysis , power (physics) , physics , quantum mechanics , voltage , machine learning

The effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General equations and procedure for constructing the equivalent circuit for N parallel units are presented. Results obtained, for N=1,2,3, using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included

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