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Testing and Diagnosing Dynamic Reconfigurable FPGA
Author(s) -
Chi-Feng Wu,
ChengWen Wu
Publication year - 1999
Publication title -
vlsi design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.123
H-Index - 24
eISSN - 1065-514X
pISSN - 1026-7123
DOI - 10.1155/2000/79281
Subject(s) - reconfigurability , field programmable gate array , control reconfiguration , emulation , reconfigurable computing , computer science , embedded system , computer architecture , telecommunications , economics , economic growth
Dynamic reconfigurable field-programmable logic arrays (FPGAs) are receiving notableattention because of their much shorter reconfiguration time as compared withtraditional FPGAs. The short reconfiguration time is vital to applications such asreconfigurable computing and emulation. We show in this paper that testing anddiagnosis of the FPGA also can take advantage of its dynamic reconfigurability. Wefirst propose an efficient methodology for testing the interconnects of the FPGA, thenpresent several universal test and diagnosis approaches which cover all functional unitsof the FPGA. Experimental results show that our approach significantly reduces thetesting time, without additional cost for diagnosis

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