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A Case Study of Self-Checking Circuits Reliability
Author(s) -
Jien-Chung Lo
Publication year - 1998
Publication title -
vlsi design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.123
H-Index - 24
eISSN - 1065-514X
pISSN - 1026-7123
DOI - 10.1155/1998/71348
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , electronic circuit , electronic engineering , engineering , electrical engineering , physics , power (physics) , quantum mechanics
In this paper, we analyze the reliability of self-checking circuits. A case study is presentedin which a fault-tolerant system with duplicated self-checking modules is comparedto the TMR version. It is shown that a duplicated self-checking system has a much higherreliability than that of the TMR counterpart. More importantly, the reliability of the self-checkingsystem does not drop as sharply as that of the TMR version. We alsodemonstrate the trade-offs between hardware complexity and error handling capabilityof self-checking circuits. Alternative self-checking designs where some hardwareredundancies are removed with the lost of fault-secure and/or self-testing propertiesare also studied

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