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In this paper we present an approach for combining on-line concurrent checking (CC)with off-line built-in self-test (BIST). We will show that a reduction of an aliasingprobability can be obtained for manufacturing testing by monitoring the output of aconcurrent checker and a reduction of a probability of not detecting an error in thecomputing mode can be obtained by a short periodic BIST. We will present a techniquefor optimal selection of error-detecting codes for combined on-line CC and off-linespace-time compression of test responses for BIST and estimate probabilities of notdetecting an error for the approach based on integrating CC and BIST. We also present atechnique for on-line error-detection in space-time compressors of test responses forBIST

Integrated On-Line and Off-Line Error Detection Mechanisms in the Coding Theory Framework