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Two-dimensional Modelling of HEMTs Using Multigrids with Quantum Correction
Author(s) -
E. A. B. Cole,
Tobias Boettcher,
C.M. Snowden
Publication year - 1998
Publication title -
vlsi design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.123
H-Index - 24
eISSN - 1065-514X
pISSN - 1026-7123
DOI - 10.1155/1998/61608
Subject(s) - isothermal process , high electron mobility transistor , multigrid method , poisson's equation , current density , poisson distribution , current (fluid) , mathematics , layer (electronics) , schrödinger's cat , perpendicular , quantum , mathematical analysis , materials science , condensed matter physics , physics , quantum mechanics , geometry , differential equation , thermodynamics , composite material , transistor , statistics , voltage
The two-dimensional multi-layered HEMT is modelled isothermally by solving thePoisson and current continuity equations consistently with the Schrödinger equation. Amultigrid method is used on the Poisson and current continuity equations while theelectron density is calculated at each level by solving the Schrödinger equation in onedimensionalslices perpendicular to the layer structure. A correction factor is introducedwhich enables relatively accurate solutions to be obtained using a low number ofeigensolutions. A novel method for discretising the current density which can begeneralised to the non-isothermal case is described. Results are illustrated using a twolayer AlGaAs-GaAs HEMT

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