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Inclusion of Quantum Confinement Effects in Self-Consistent Monte Carlo Device Simulations
Author(s) -
R. W. Kelsall,
A. J. Lidsey
Publication year - 1998
Publication title -
vlsi design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.123
H-Index - 24
eISSN - 1065-514X
pISSN - 1026-7123
DOI - 10.1155/1998/57936
Subject(s) - monte carlo method , quantum monte carlo , statistical physics , schrödinger equation , physics , hybrid monte carlo , monte carlo molecular modeling , monte carlo method in statistical physics , poisson's equation , dynamic monte carlo method , coupling (piping) , quantum , schrödinger's cat , quantum mechanics , computational physics , mathematics , markov chain monte carlo , materials science , statistics , metallurgy
The design of Monte Carlo FET simulations is discussed, with specific attention to the methods used to describe quantum confinement effects. A new model is presented, which employs self-consistent coupling of Schrodinger, Poisson and Monte Carlo algorithms, and explicit calculation of the scattering rates between confined and unconfined states. Comparisons between the new model and a standard semi-classical Monte Carlo model are presented for a 0.1 μm gate-length In0.52Al0.48As/In0.53 Ga0.47As/InP MODFET. Whilst the quantum model yields minor corrections in the predicted output characteristics, it is found that these results can be achieved without repeated iterations of the Schrodinger equation

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