TOPS: A Target-Oriented Partial Scan Design Package Based on Simulated Annealing

In this paper, we describe algorithms based on Simulated Annealing for selecting a subset of flip-flops to beconnected into a scan path. The objective for selection is to maximize the coverage of faults that are aborted bya sequential fault simulator. We pose the problem as a combinatorial optimization, and present a heuristic algorithmbased on Simulated Annealing. The SCOAP testability measure is employed to assess the selection of flip-flopsduring the course of optimization. Our algorithms form a part of an integrated design package, TOPS, which hasbeen designed as an enhancement to the OASIS standard-cell design automation system available from MCNC.We discuss the TOPS package and its performance on a number of ISCAS'89 benchmarks. We also present acomparative evaluation of the benchmark results