English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Current drawn by a static CMOS VLSI integrated circuit during quiescent periods is extremely small and isnormally of the order of nanoamperes. However, it is remarkably susceptible to a number of failure modes. Manyfaults present in such ICs cause the quiescent power-supply current (IDDQ) to increase by several orders ofmagnitude. Some of these faults may not manifest themselves as logical faults, and would not be detected bytraditional IC test techniques

Resolution Enhancement in IDDQ Testing for Large ICs

Resolution Enhancement in I_DDQ Testing for Large ICs