Computer-Aided Testing Systems: Evaluation and Benchmark Circuits | Zendy

S. Mourad | Zendy

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Computer-Aided Testing Systems: Evaluation and Benchmark Circuits

Author(s) -

S. Mourad

Publication year - 1993

Publication title -

vlsi design

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.123

H-Index - 24

eISSN - 1065-514X

pISSN - 1026-7123

DOI - 10.1155/1993/89495

Subject(s) - benchmark (surveying) , automatic test pattern generation , computer science , electronic circuit , benchmarking , computer engineering , fault (geology) , testability , representation (politics) , fault coverage , algorithm , electronic engineering , reliability engineering , engineering , electrical engineering , geodesy , seismology , geology , geography , marketing , politics , law , business , political science

As the demand on Computer-Aided Testing Systems (CATS)—Automatic Test Pattern Generation (ATPG) andlogic and fault simulations as well as testability analysis—increases and the choice becomes more varied, a needto compare the merits of the different systems emerges. Benchmark circuits are used to carry out the comparisons

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