Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays | Zendy

Earl E. Swartzlander | Zendy; Miroslaw Malek | Zendy

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Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays

Author(s) -

Earl E. Swartzlander,

Miroslaw Malek

Publication year - 1993

Publication title -

vlsi design

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.123

H-Index - 24

eISSN - 1065-514X

pISSN - 1026-7123

DOI - 10.1155/1993/76586

Subject(s) - bridging (networking) , very large scale integration , electronic circuit , segmentation , computer science , algorithm , computer engineering , parallel computing , embedded system , engineering , artificial intelligence , electrical engineering , computer network

This paper presents a new test approach that is suitable for repetitive structures such as cellular arrays. As such,it is directly applicable to most arithmetic circuits which are generally quite regular. It is based on exhaustivetesting of overlapping segments of the array. This approach detects bridging faults in addition to stuck-at faults.Such bridging faults are a significant problem in arithmetic circuits. The ability to detect arbitrary faults involvingany cells within a designer selected distance (i.e., the diameter of the subset that is exhaustively tested) is uniqueto this testing approach. The high coverage of the proposed technique makes it attractive for testing current VLSIand future WSI arrays

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