Influence of Thermal Treatment Under Various Oxygen Pressures on The Electronic Properties of Ceramics and Single Crystals of Pure and Tin-Doped Indium Oxide
Author(s) -
Shijie Wen,
G. Campet,
J. Portier
Publication year - 1991
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.144
H-Index - 22
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/1992/56168
Subject(s) - indium , tin , indium tin oxide , doping , ceramic , materials science , oxygen , band diagram , oxide , oxygen pressure , thermal , inorganic chemistry , chemistry , nanotechnology , metallurgy , optoelectronics , layer (electronics) , band gap , thermodynamics , organic chemistry , physics
The different electronic behaviors of pure and tin-doped indium oxides with various thermal treatmentsunder high and low oxygen pressure are discussed on the basis of the evolution of the band energydiagram. A critical concentration of “active oxygen vacancies” associated with donor centers is necessaryto achieve high electronic mobility in ITO (Indium Tin Oxide)
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