Electrical Modelling of Multilevel On-Chip Interconnections for High-Speed Integrated Circuits
Author(s) -
K. Z. Dimopoulos,
J.N. Avaritsiotis,
S. J. White
Publication year - 1991
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.144
H-Index - 22
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/1992/13545
Subject(s) - inductance , capacitance , interconnection , lossy compression , chip , electronic circuit , electronic engineering , integrated circuit , lcr meter , nonlinear system , transmission line , electric power transmission , voltage , electrical engineering , engineering , computer science , physics , telecommunications , electrode , quantum mechanics , artificial intelligence
A method for the electrical parameters analysis and modelling of lossy-coupled multilayer on-chipinterconnection lines at high bit rates is presented in detail. It can be used by the VLSI designer toanalyze on-chip interconnections with linear, as well as nonlinear/time varying terminators and tosimulate the pulse propagation characteristics in high-speed integrated circuits. First the capacitance,inductance, conductance and resistance matrices per unit length for the given multiconductor geometryis computed. A multiple coupled line model consisting of uncoupled lossy transmission lines and lineardependent current and voltage sources if finally calculated according to the capacitance, inductance,conductance and resistance matrix values computed
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