Open AccessStudy of Thick Film Resistors By 1/f Noise Measurements
Author(s) -
A. Ambrózy,
E.I. Hahn,
L.B. Kiss,
G. Trefán
Publication year - 1988
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.144
H-Index - 22
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/1989/36201
Subject(s) - resistor , noise (video) , materials science , electrical engineering , acoustics , engineering , computer science , physics , voltage , artificial intelligence , image (mathematics)
Knowledge on the conduction mechanism of thick film resistors are limited and oftencontradictory
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom