Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments | Zendy

Franz Müller | Zendy; Manfred Wolf | Zendy

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Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments

Author(s) -

Franz Müller,

Manfred Wolf

Publication year - 1987

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.144

H-Index - 22

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/1988/54096

Subject(s) - resistor , grain size , electrical resistivity and conductivity , volume fraction , materials science , composite material , thermal conduction , noise (video) , volume (thermodynamics) , temperature coefficient , sheet metal , electrical conductor , current (fluid) , condensed matter physics , electrical engineering , thermodynamics , physics , engineering , voltage , image (mathematics) , artificial intelligence , computer science

Experimental results concerning the dependence of the sheet resistivity and the noisecoefficient on the grain size and the volume fraction, respectively, of the metallic-likecomponent in Bi2Ru2O7-based thick-film resistors are presented. The results arecompared with current models for the electrical conduction mechanism in theseresistors

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