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Experimental results concerning the dependence of the sheet resistivity and the noisecoefficient on the grain size and the volume fraction, respectively, of the metallic-likecomponent in Bi2Ru2O7-based thick-film resistors are presented. The results arecompared with current models for the electrical conduction mechanism in theseresistors

active and passive electronic components

Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments