Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper) | Zendy

Jørgen Møltoft | Zendy

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Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper)

Author(s) -

Jørgen Møltoft

Publication year - 1987

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.144

H-Index - 22

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/1987/23687

Subject(s) - weibull distribution , electronic component , exponential distribution , computer science , reliability engineering , component (thermodynamics) , field (mathematics) , test data , hazard , statistics , exponential function , data mining , engineering , mathematics , electrical engineering , mathematical analysis , physics , chemistry , organic chemistry , pure mathematics , thermodynamics , programming language

Methods of statistically analysing data from electronic component lifetests are discussed. Particular emphasis is given toanalysis techniques using the assumptions of constant hazard rate (Exponential distribution), the Weibull distributionand mixed Weibull distributions. The methods used for analysing Weibull data when the data itself is non-uniform dueto both removal of test samples during test and also the non-continuance of surveillance of components under test arediscussed. Attention is finally given to the effect of two or more failure mechanisms which can produce S-shapedpatterns when data is plotted on Weibull Graph paper

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