Open AccessMicrostructural Studies of Ni-P Thick Film Resistor Temperature Sensors
Author(s) -
Barbara Holodnik,
A. Jakubowicz,
Marian Lukaszewicz,
W. Hauffe
Publication year - 1986
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.144
H-Index - 22
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/1986/37913
Subject(s) - resistor , materials science , optoelectronics , composite material , electrical engineering , engineering physics , engineering , voltage
Thick Ni-P films have been widely investigated at our Institute. This article tends to visualize by use of various microscopic methods how the growth and sintering of individual conducting grains, results in the formation of nickel dendrites responsible for the metallic character of electrical conduction
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